David M Wieliczka: search on Z-Library

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1

Flux measurement for x-ray photoelectron spectroscopy

Wieliczka, David M., Wagner, Eric, Wintergerst, Jose

Journal:

Review of Scientific Instruments

Year:

1995

Language:

english

File:

PDF, 450 KB

english, 1995

2

SPIE Proceedings [SPIE Photonics West '97 - San Jose, CA (Saturday 8 February 1997)] Laser Applications in Microelectronic and Optoelectronic Manufacturing II - XPS study of laser-assisted etching of InP in a chlorine atmosphere

Wrobel, Jerzy M., Moffitt, Christopher E., Wieliczka, David M., Dubowski, Jan J., Dubowski, Jan J.

Year:

1997

Language:

english

File:

PDF, 639 KB

english, 1997

3

SPIE Proceedings [SPIE Photonics West '95 - San Jose, CA (Wednesday 1 February 1995)] Lasers in Dentistry - Spectroscopic comparison of the effects of CO2, Nd:YAG, and water-cooled Nd:YAG on tooth root

Spencer, Paulette, Cobb, Charles M., McCollum, Mark H., Wieliczka, David M., Wigdor, Harvey A., Featherstone, John D. B., White, Joel M.

Year:

1995

Language:

english

File:

PDF, 288 KB

english, 1995

4

Wedge shaped cell for highly absorbent liquids: infrared optical constants of water

Wieliczka, David M., Weng, Shengshan, Querry, Marvin R.

Journal:

Year:

1989

Language:

english

File:

PDF, 751 KB

english, 1989

5

Anomalous copper diffusion through samarium

Wieliczka, David M.

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Year:

1990

Language:

english

File:

PDF, 645 KB

english, 1990

6

SPIE Proceedings [SPIE BiOS '99 International Biomedical Optics Symposium - San Jose, CA (Saturday 23 January 1999)] Biomedical Applications of Raman Spectroscopy - Spectroscopic and morphologic characterization of the dentin/adhesive interface

Lemor, R. M., Kruger, Michael B., Wieliczka, David M., Swafford, Jim R., Spencer, Paulette, Morris, Michael D.

Year:

1999

Language:

english

File:

PDF, 1.85 MB

english, 1999

7

Change in Temperature of Subjacent Bone During Soft Tissue Laser Ablation

Spencer, Paulette, Cobb, Charles M., Wieliczka, David M., Glaros, Alan G., Morris, Patrick J.

Journal:

Journal of Periodontology

Year:

1998

Language:

english

File:

PDF, 590 KB

english, 1998

8

XPS study of XeCl excimer-laser-etched InP

Jerzy M Wrobel, Christopher E Moffitt, David M Wieliczka, Jan J Dubowski, Jeffrey W Fraser

Journal:

Applied Surface Science

Year:

1998

Language:

english

File:

PDF, 1.18 MB

english, 1998

9

Depth Profiled XPS Analysis of a Polymerized Silicon-Carbon Thin Film

Paul R. Scott, David M. Wieliczka, Michael B. Kruger

Journal:

Plasma Chemistry and Plasma Processing

Year:

2009

Language:

english

File:

PDF, 235 KB

english, 2009

10

Equilibrium vapor pressure of mercury from dental amalgam in vitro

David M. Wieliczka, Paulette Spencer, Christopher E. Moffitt, Eric J. Wagner, Angela Wandera

Journal:

Dental Materials

Year:

1996

Language:

english

File:

PDF, 745 KB

english, 1996

11

The interferometric system using optical vortices as phase markers

Jan Masajada, Agnieszka Popiołek-Masajada, David M. Wieliczka

Journal:

Optics Communications

Year:

2002

Language:

english

File:

PDF, 703 KB

english, 2002

12

Photoelectric yield measurements of rare-earth trifluorides in the 30–250-eV photon energy range

Bartlett, Roger J., Wieliczka, David M., Olson, Clifford G.

Journal:

Journal of Applied Physics

Year:

1989

Language:

english

File:

PDF, 632 KB

english, 1989

13

Aging of Oxygen-Treated Trimethylsilane Plasma-Polymerized Films Using Spectroscopic Ellipsometry

El-Agez, Taher M., Wieliczka, David M., Moffitt, Chris, Taya, Sofyan A.

Journal:

Journal of Atomic Molecular and Optical Physics

Year:

2011

Language:

english

File:

PDF, 278 KB

english, 2011

14

SPIE Proceedings [SPIE Optoelectronics and High-Power Lasers & Applications - San Jose, CA (Saturday 24 January 1998)] Laser Applications in Microelectronic and Optoelectronic Manufacturing III - Low-fluence laser-assisted chemical etching of InP: an XPS study

Moffitt, Christopher E., Dubowski, Jan J., Dyer, Peter E., Wrobel, Jerzy M., Wieliczka, David M., Dubowski, Jan J., Fraser, Jeffrey W.

Year:

1998

Language:

english

File:

PDF, 1.72 MB

english, 1998

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